Testing base for semiconductor devices
US6501291B1 · kind B1 · utility
Assignee
Inventor
Key dates
| Filing date | Sep 26, 2000 |
| Grant date | Dec 31, 2002 |
| Priority date | — |
| Expiry date | Oct 13, 2020 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01R1/0433
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A testing base for a semiconductor device includes a retaining seat, a base board and a press unit. The retaining seat has a top side formed with a receiving cavity. The receiving cavity is adapted to receive the semiconductor device therein. The base board is mounted in a bottom portion of the receiving cavity of the retaining seat. The base board has a contacting side that confronts a contact mounting side of the semiconductor device when the semiconductor device is received in the receiving cavity. The contacting side is provided with a plurality of conductive contact pads adapted to connect electrically and respectively with contact members on the contact mounting side of the semiconductor device. The base board further has a plurality of contact terminals that extend outwardly through the retaining seat and that are connected electrically to the contact pads. The press unit is mounted on the retaining seat and is operable so as to press the semiconductor device toward the base board to ensure electrical connection between the semiconductor device and the base board.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.