Method and apparatus for influencing X-rays in a beam path
US6501828B1 · kind B1 · utility
Assignee
Inventor
Key dates
| Filing date | Oct 20, 2000 |
| Grant date | Dec 31, 2002 |
| Priority date | — |
| Expiry date | Oct 20, 2020 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01N2223/612
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
An x-ray apparatus has an x-ray source and an x-ray receiver, the x-ray source being adjustable relative to a subject and emitting x-rays in the direction toward the x-ray receiver during the course of radiological exposures of the subject. The x-ray apparatus has an arrangement in the beam path of the x-rays for influencing the shape and/or the intensity profile of the x-ray beam, and this arrangement is dynamically adjustable during radiological exposures of the subject for influencing the shape and/or the intensity profile of the x-rays.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.