Two-output voltage test system
US6504381B1 · kind B1 · utility
Assignee
Inventor
Key dates
| Filing date | Oct 2, 2000 |
| Grant date | Jan 7, 2003 |
| Priority date | — |
| Expiry date | Nov 18, 2020 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01R27/18
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
The disclosure provides a two-output voltage test system, wherein the system includes a plurality of D/A converters, buffers, sinusoidal wave generators, power amplifiers, and a micro-processing controller. The two-output voltage test system provides for a number of processes including one group of the plurality of D/A converters, buffers, sinusoidal wave generators, and power amplifiers to perform the measurement of AC voltage durability (WAC), DC voltage durability (WDC), insulation resistance (IR), and leakage current (LK). The other group of the plurality of D/A converters, buffers, sinusoidal wave generators, and power amplifiers performs the measurement of ground resistance (GR). The micro-processing controller outputs the measurements simultaneously or with slight time delay in order to obtain the results measured at the same time.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.