Electrical test tool having easily replaceable electrical probe
US6504388B2 · kind B2 · utility
7Cited by
16References
2Claims
0Family size
Assignee
Inventors
Key dates
| Filing date | Dec 16, 1999 |
| Grant date | Jan 7, 2003 |
| Priority date | — |
| Expiry date | Dec 16, 2019 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01R1/06705
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
Disclosed is an improved probe housing mechanism that will allow for the quick release of a probe tip from a testing tool. The invention includes a probe housing, a double cantilevered beam for holding a probe tip, and a releasable spring mechanism for holding the beam into place. The spring mechanism can be released by squeezing the spring together or by releasing a non-removable locking screw, thereby allowing the beam to be slidably removed from the probe housing for easy replacement.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.