Method and apparatus for calibration and validation of high performance DUT power supplies
US6504395B1 · kind B1 · utility
20Cited by
5References
17Claims
0Family size
Assignee
Inventor
Key dates
| Filing date | Aug 30, 2001 |
| Grant date | Jan 7, 2003 |
| Priority date | — |
| Expiry date | Aug 30, 2021 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01R35/00
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A power supply circuit is disclosed for use with a semiconductor tester to power a device-under-test. The power supply includes power generation circuitry disposed in the tester to generate power for the device-under-test. Load circuitry is disposed within the tester and coupled to the power generation circuitry to selectively simulate the electrical loading of a device-under-test on the power supply.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.