Interferometer spectrometer with reduced alignment sensitivity
US6504614B1 · kind B1 · utility
Assignee
Inventors
Key dates
| Filing date | Oct 8, 1999 |
| Grant date | Jan 7, 2003 |
| Priority date | — |
| Expiry date | Oct 8, 2019 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01J3/453
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
An interferometer spectrometer that has reduced alignment sensitivity is described herein. Parallelism of an output ray pair formed by a single input ray is not affected by variations in relative alignment of the components. In comparison to other compensated interferometer designs, lateral separation errors in the output ray pair due to optical component misalignment are reduced. The reduced alignment sensitivity may be accomplished by utilizing simple planar components that are common to both light paths. The reduced alignment sensitivity and simplicity in design provides a more compact and more robust interferometer, with reduced manufacturing costs associated therewith. An elliptical field of view light source that utilizes an array of collimator lenses is also described. The light source provides a more compact design than a single circular collimator lens of the same area, and is suitable for single channel or multi-channel use.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.