Patent · US Expired

Method and apparatus for self-testing and maintaining alignment of an optical beam in an optical switch

US6504965B2 · kind B2 · utility

8Cited by
2References
29Claims
0Family size

Assignee

Inventors

Key dates

Filing dateDec 7, 2000
Grant dateJan 7, 2003
Priority date
Expiry dateMar 14, 2021

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG02B6/3544
  • WIPO fieldOptics
  • WIPO sectorInstruments

Abstract

An optical processing element such as an optical switch for which continuous or periodic self-testing and/or alignment is provided. In one embodiment, an optical sensor is disposed in a semiconductor substrate layer within a region surrounding an optical path of an optical output port of the optical processing element. In one embodiment, an optical fiber optically coupled to the optical output port is disposed in a V-groove in which the optical sensor is disposed. In one embodiment, circuitry is coupled to the optical sensor to adjust continuously or periodically over time the alignment of an optical beam directed to the optical output port.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.