Connection integrity monitor for digital selection circuits
US6505310B1 · kind B1 · utility
9Cited by
16References
19Claims
0Family size
Assignee
Inventors
Key dates
| Filing date | Sep 17, 1999 |
| Grant date | Jan 7, 2003 |
| Priority date | — |
| Expiry date | Sep 17, 2019 |
Classification
- Technology area (CPC H)Electricity
- CPC primaryH04Q2213/13163
- WIPO fieldDigital communication
- WIPO sectorElectrical engineering
Abstract
A circuit connection integrity monitor detecting and isolating connection faults in data path cards is disclosed. A connection integrity monitoring method and corresponding apparatus are applicable to selector and cross-connect circuits and permit a user to monitor all points where signal traffic may be prone to misconnection.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.