Patent · US Expired

MS/MS scan methods for a quadrupole/time of flight tandem mass spectrometer

US6507019B2 · kind B2 · utility

44Cited by
7References
16Claims
0Family size

Assignee

Inventors

Key dates

Filing dateMay 25, 2001
Grant dateJan 14, 2003
Priority date
Expiry dateMay 25, 2021

Classification

  • Technology area (CPC H)Electricity
  • CPC primaryH01J49/4225
  • WIPO fieldElectrical machinery, apparatus, energy
  • WIPO sectorElectrical engineering

Abstract

There is provided a method of effecting mass analysis on an ion stream, the method comprising passing the ion stream through a first mass resolving spectrometer, to select parent ions having a first desired mass-to-charge ratio. The parent ions are then subject to collision-induced dissociation (CID) to generate product ions, and the product Ions and any remaining parent ions are trapped the CID and trapping can be carried out together in a linear ion trap. Periodically pulses of the trapped ions are released into a time of flight (TOF) instrument to determine the mass-to-charge ratio of the ions. The delay between the release of the pulses and the initiation of the push-pull pulses of the TOF instrument are adjusted to maximize the duty cycle efficiency and hence the sensitivity for a selected ion with a desired mass-to-charge ratio. This technique can be used to optimize the performance for a parent ion scan, and MRM scan or a neutral loss scan.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.