Test head assembly
US6507203B1 · kind B1 · utility
Assignee
Inventor
Key dates
| Filing date | Dec 1, 1999 |
| Grant date | Jan 14, 2003 |
| Priority date | — |
| Expiry date | Dec 1, 2019 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01R31/2886
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
Disclosed is a test head assembly for a test system, comprising a test head having a plurality of test head contact areas for providing electronic signals to one or more devices under test (DUT) and/or for receiving electronic signals therefrom. The test head assembly further comprises fastening means for fastening one or more individual, physically separated DUT boards to the test head, each DUT board being provided for holding one or more of the DUTs and adapting electrical contacts thereof to at least one of the plurality of test head contact areas. In order to provide a flexible and modular test head arrangement allowing an easy exchange of different DUT boards with different seizes, the arrangement of the fastening means and the plurality of test head contact areas is commensurable, so that one or more DUT boards with same and/or different lateral dimensions are attachable to the test head.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.