Patent · US Expired

Rapid X-ray diffraction screening method of polymorph libraries created in multi-well plates

US6507636B1 · kind B1 · utility

17Cited by
10References
19Claims
0Family size

Assignee

Inventor

Key dates

Filing dateFeb 10, 2000
Grant dateJan 14, 2003
Priority date
Expiry dateFeb 10, 2020

Classification

  • Technology area (CPC B)Performing Operations; Transporting
  • CPC primaryB01L2300/185
  • WIPO fieldMeasurement
  • WIPO sectorInstruments

Abstract

Method and device for rapid characterization of arrays of crystalline, polycrystalline or amorphous materials; in particular for the formation and X-ray diffraction analysis of polymorph libraries and the discovery of new crystal forms. According to one aspect, a multi-well plate comprising a masking plate with an array of openings and a removable base plate is used to crystallize precipitates. X-ray diffraction analysis is performed by scanning an X-ray beam over the base plate and recording diffractograms of the crystalline precipitates.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.