Patent · US Expired

Timing verifying method

US6507936B2 · kind B2 · utility

15Cited by
2References
9Claims
0Family size

Assignee

Inventor

Key dates

Filing dateApr 20, 2001
Grant dateJan 14, 2003
Priority date
Expiry dateAug 2, 2021

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG06F30/33
  • WIPO fieldComputer technology
  • WIPO sectorElectrical engineering

Abstract

In accordance with a timing verifying method of the present invention, the step of calculating a variation delay time composed of a wire delay time and a cell delay time in consideration of a process varying condition is performed independently of the step of performing logic simulation of a semiconductor integrated circuit based on the calculated variation delay time.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.