Method of fabricating group III-V nitride compound semiconductor and method of fabricating semiconductor device
US6508879B1 · kind B1 · utility
Assignee
Inventor
Key dates
| Filing date | Nov 10, 2000 |
| Grant date | Jan 21, 2003 |
| Priority date | — |
| Expiry date | Nov 10, 2020 |
Classification
- Technology area (CPC C)Chemistry; Metallurgy
- CPC primaryC30B29/406
- WIPO fieldSurface technology, coating
- WIPO sectorChemistry
Abstract
A method of fabricating a group III-V nitride compound semiconductor in which high crystallinity is achieved without lack of nitrogen, even when it is grown at a low temperature, and a method of fabricating a semiconductor device employing the method of fabricating a group III-V nitride compound semiconductor are provided. Along with carrier gas, a gas source including a nitrogen-including compound such as hydrazine, a substitution product of hydrazine, amine or azide as a nitrogen source is supplied to a reaction tube of a MOCVD apparatus. These nitrogen-including compounds have higher decomposition efficiencies than those of ammonia. Therefore, even though MOCVD is performed at a growth temperature below or equal to 900° C., a large amount of nitrogen which contributes growth is supplied onto the growth surface of a substrate (that is, an underlying layer). As a result, crystallinity of the group III-V nitride compound semiconductor layer is improved. Further, the amount of the supplied nitrogen source relative to the amount of the source of the group V element supplied can be made smaller.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.