Method and apparatus for self-diagnosis of a sensor
US6510397B1 · kind B1 · utility
27Cited by
116References
27Claims
0Family size
Assignee
Inventor
Key dates
| Filing date | Mar 13, 1999 |
| Grant date | Jan 21, 2003 |
| Priority date | — |
| Expiry date | Mar 13, 2019 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01L19/0092
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
The present invention is a method and apparatus for determining whether the sensors or the used in a device monitoring system are properly functioning before rendering a determination as to a defect within the device itself. As a result, maintenance costs may be reduced while limiting the number of false indications of failure, thereby increasing the reliability of the monitoring system.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.