Method and system for selective soldering process characterization
US6510724B1 · kind B1 · utility
Assignee
Inventors
Key dates
| Filing date | Jun 8, 2000 |
| Grant date | Jan 28, 2003 |
| Priority date | — |
| Expiry date | May 29, 2021 |
Classification
- Technology area (CPC H)Electricity
- CPC primaryH05K2203/163
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
In a selective soldering machine (FIG. 1, 5), a calibration circuit board (FIG. 2, 100) makes contact with a solder wave (FIG. 1, 25). The calibration circuit board (100) is interfaced with a desktop computer unit (FIG. 4, 160) through a optoisolator unit (FIG. 4, 150). The desktop computer unit (160) records which of the contact points (FIG. 2, 120) distributed on the calibration circuit board (100) come into contact with the solder wave (25). This data is then used to establish the solder contact area (FIG. 6, 129) as a function of the various parameters of the selective soldering machine (5). These parameters include the flow rate and flow pressure of solder from the solder pot, the angle of inclination of the electronics board (FIG. 1, 30), the speed of the solder pump (12), the distance from the leads (39) to the solder wave (25), the motion vector which a gantry (50) applies to the electronics board (30), and any preheating which may be applied the electronics board (30).
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.