Quality control for laser peening
US6512584B1 · kind B1 · utility
18Cited by
7References
49Claims
0Family size
Assignee
Inventors
Key dates
| Filing date | Jun 29, 1998 |
| Grant date | Jan 28, 2003 |
| Priority date | — |
| Expiry date | Jun 29, 2018 |
Classification
- Technology area (CPC C)Chemistry; Metallurgy
- CPC primaryC21D10/005
- WIPO fieldMaterials, metallurgy
- WIPO sectorChemistry
Abstract
A method of testing the operation of a laser peening system includes providing a sensor in a possible laser beam path, applying a transparent overlay material to the sensor, directing a pulse of coherent energy to the sensor through the transparent overlay material to create a shock wave, and determining a characteristic of the created shock wave with the sensor.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.