Patent · US Expired

Semiconductor integrated circuit device allowing accurate evaluation of access time of memory core contained therein and access time evaluating method

US6512707B2 · kind B2 · utility

9Cited by
3References
9Claims
0Family size

Assignee

Inventors

Key dates

Filing dateApr 19, 2001
Grant dateJan 28, 2003
Priority date—
Expiry dateApr 19, 2021

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG11C11/401
  • WIPO fieldComputer technology
  • WIPO sectorElectrical engineering

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.