Patent · US Expired

Methods and systems for evaluating defects in metals

US6512982B2 · kind B2 · utility

12Cited by
8References
44Claims
0Family size

Assignee

Inventors

Key dates

Filing dateDec 20, 2000
Grant dateJan 28, 2003
Priority date
Expiry dateApr 22, 2021

Classification

  • Technology area (CPC Y)Emerging Cross-Sectional Technologies
  • CPC primaryY10S707/99943
  • WIPO fieldMeasurement
  • WIPO sectorInstruments

Abstract

A method and system for evaluating structural defects in metals is provided. In one embodiment, the method recognizes that the acceptability of a given defect is principally determined by the four basic parameters of operating temperature, operating stress, defect area, and defect shape. Ranges are established for each of these four basic parameters, and intermediate values within these ranges are selected to create a series of index value data sets. The method evaluates these index value data sets by calculating a life cycles estimate for each. Using statistical methods, the life cycles results are analyzed to determine the effect each of the four basic parameters has on the life of a component with a defect. Understanding the relationship between these four basic parameters and life cycles enables the method to provide an interpolation algorithm for finding the life cycles for any component having a defect.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.