System and method for storing, retrieving, and analyzing characterization data
US6513043B1 · kind B1 · utility
Assignee
Inventors
Key dates
| Filing date | Sep 1, 2000 |
| Grant date | Jan 28, 2003 |
| Priority date | — |
| Expiry date | May 21, 2021 |
Classification
- Technology area (CPC Y)Emerging Cross-Sectional Technologies
- CPC primaryY10S707/99943
- WIPO fieldComputer technology
- WIPO sectorElectrical engineering
Abstract
A technique for efficiently structuring a database takes advantage of redundancy in data point conditions to reduce the time associated with the insertion of data points into a database and to reduce the amount of required storage space. The technique is particularly suited for semiconductor characterization data having a large number of test data points collected under repeated test conditions. The data point conditions are analyzed to inventory the different unique conditions associated with the given set of data points. Each unique combination of conditions is assigned a variable array, and each variable array element identifies a specific condition. The data point values are linked to variable set handles that represent the different variable arrays. In this manner, the data points can be inserted into the database without having to store each data point value with all of the corresponding conditions. Rather, the data point values are stored along with their respective variable set handles. The present invention also provides techniques for data extraction, management, and analysis, along with a database management system configured to carry out the various techniques.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.