Magnetic head induction coil fabrication method utilizing aspect ratio dependent etching
US6515826B1 · kind B1 · utility
Assignee
Inventors
Key dates
| Filing date | Aug 14, 2000 |
| Grant date | Feb 4, 2003 |
| Priority date | — |
| Expiry date | Oct 11, 2020 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG11B5/3163
- WIPO fieldAudio-visual technology
- WIPO sectorElectrical engineering
Abstract
A magnetic head including a dual layer induction coil. Following the deposition of a first magnetic pole (P1) a first induction coil is fabricated. Following a chemical mechanical polishing (CMP) step a layer of etchable insulation material is deposited followed by the fabrication of a second induction coil etching mask. A reactive ion etch process is then conducted to etch the second induction coil trenches into the second etchable insulation material layer. The etching depth is controlled by the width of the trenches in an aspect ratio dependent etching process step. The second induction coil is next fabricated into the second induction coil trenches, preferably utilizing electrodeposition techniques. Thereafter, an insulation layer is deposited upon the second induction coil, followed by the fabrication of a second magnetic pole (P2) upon the insulation layer.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.