Patent · US Expired

Circuit configuration for testing and A/D converter for applications that are critical in terms of safety

US6518900B1 · kind B1 · utility

7Cited by
8References
6Claims
0Family size

Assignee

Inventors

Key dates

Filing dateSep 6, 2001
Grant dateFeb 11, 2003
Priority date
Expiry dateSep 6, 2021

Classification

  • Technology area (CPC H)Electricity
  • CPC primaryH03M1/12
  • WIPO fieldBasic communication processes
  • WIPO sectorElectrical engineering

Abstract

The present invention relates to a circuit configuration with an A/D converter, especially for applications that are critical in terms of safety, which is especially characterized by a ramp signal generator for generating a ramp voltage that is delivered to the input of the A/D converter, and a test circuit for activating a test cycle which comprises a first run of the ramp, by which a reference measurement of the ramp signal generator is carried out for compensating component tolerances, and comprises a second run of the ramp where an error signal is output when the value that is calculated for a transmission characteristic of the A/D converter lies outside a predetermined tolerance range of the measured value of the transmission characteristic.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.