X-ray based measuring device
US6519314B1 · kind B1 · utility
Assignee
Inventors
Key dates
| Filing date | Dec 22, 2000 |
| Grant date | Feb 11, 2003 |
| Priority date | — |
| Expiry date | Dec 22, 2020 |
Classification
- Technology area (CPC A)Human Necessities
- CPC primaryA61B6/4085
- WIPO fieldMedical technology
- WIPO sectorInstruments
Abstract
An X-ray based measuring device of the invention includes: X-ray imaging means (102, 103, 311) which have their detection areas divided into a plurality of detector units (102a to 102d, 201′), detect X-rays transmitted through an inspection object (106), and pick up X-ray images in interested areas (310, 902, 902′) of the inspection object; conversion means (211, 212) for converting analog image signals read from the detector units into digital image data under specified conversion conditions for each of the detector units; and re-conversion means (214, 222) for converting the digital image data obtained for each of the detector units under re-conversion conditions corresponding to the specified conversion conditions, wherein analog image signals are A/D converted into digital image data under optimum conversion conditions for each detector unit, and X-ray images in interested areas of the inspection object are sequentially picked up.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.