Multiple frequency signal detector
US6519541B1 · kind B1 · utility
17Cited by
4References
18Claims
0Family size
Assignee
Inventor
Key dates
| Filing date | Jun 2, 1999 |
| Grant date | Feb 11, 2003 |
| Priority date | — |
| Expiry date | Jun 2, 2019 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01R23/16
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A method for characterizing a dual frequency (DF) signal including the steps of sampling the signal at a sampling frequency vs so as to obtain a sequence of signal samples, and obtaining an &agr;-constant and a &bgr;-constant of the DF signal meeting a predetermined criterion.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.