Diagnosis of RAMS using functional patterns
US6519725B1 · kind B1 · utility
40Cited by
7References
15Claims
0Family size
Assignee
Inventors
Key dates
| Filing date | Mar 4, 1997 |
| Grant date | Feb 11, 2003 |
| Priority date | — |
| Expiry date | Mar 4, 2017 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG11C29/14
- WIPO fieldComputer technology
- WIPO sectorElectrical engineering
Abstract
A methodology for testing embedded memories based on functional patterns that allow for easy and complete diagnosis including techniques for shortening the size of the array test, and/or the simulation turn around time, without diminishing the diagnostic accuracy.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.