Test apparatus and method of measuring mar resistance of film or coating
US6520004B1 · kind B1 · utility
30Cited by
14References
32Claims
0Family size
Assignee
Inventor
Key dates
| Filing date | Aug 3, 2000 |
| Grant date | Feb 18, 2003 |
| Priority date | — |
| Expiry date | Aug 3, 2020 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01N2203/0647
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
This invention concerns a test apparatus and procedure used for quantitative and qualitative characterization of scratch and mar behavior of films or coatings, more particularly automotive coatings. The apparatus includes a micro-indentor that penetrates and scratches the coating to be characterized together with interrelated components for measuring the force applied, the length and depth of the indentor penetration, the geometry of the disturbed coating surface as well as a system for measuring, analyzing and comparing test results.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.