Patent · US Expired

Manufacturing method for a semiconductor device

US6521482B1 · kind B1 · utility

25Cited by
3References
16Claims
0Family size

Assignee

Inventors

Key dates

Filing dateAug 3, 2000
Grant dateFeb 18, 2003
Priority date
Expiry dateAug 3, 2020

Classification

  • Technology area (CPC H)Electricity
  • CPC primaryH01L2924/3025
  • WIPO fieldSemiconductors
  • WIPO sectorElectrical engineering

Abstract

A method of manufacturing individual semiconductor devices by forming island sections 26 on the surface of a common substrate 21, forming electrodes 27 and 28 one on either side of each island section 26, die bonding a semiconductor chip 29 to each island section 26, and wire bonding the electrodes 27 and 28 to the semiconductor chip 29. A single common cover 36 is fixed over the entire surface of the common substrate 21 to form a hermetically sealed hollow space over each chip mounting section 41. The cover 36 and substrate 21 are separated at each mounting section 41 to form individual semiconductor devices.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.