System and method for simultaneously invoking automated measurements in a signal measurement system
US6522345B1 · kind B1 · utility
Assignee
Inventor
Key dates
| Filing date | Jan 12, 1998 |
| Grant date | Feb 18, 2003 |
| Priority date | — |
| Expiry date | Jan 12, 2018 |
Classification
- Technology area (CPC Y)Emerging Cross-Sectional Technologies
- CPC primaryY10S715/97
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A quick measurement apparatus and method for invoking automated measurements in a signal measurement system. The system sequentially applies one or more predetermined automated measurements to each of a plurality of predetermined waveforms. The automated measurements, which are applied to each of the user-selected waveforms in response to a single respective measurement request, measure a respective predetermined extent of each of the selected waveforms. Preferably, each single respective activation request is generated in response to the performance of an associated single operator action. It is also preferable that the system is configured to enable a user to define the sequence in which the automatic measurements are applied to the selected waveforms. The signal measurement system further includes a graphical user interface for displaying the waveforms and the measurement results. Each of the measurement requests is generated in response to a corresponding selection of a display element on the graphical user interface. Alternatively, the signal measurement system also includes a front panel keyboard. Here, each of the respective operator actions includes a depression of a dedica…
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.