Predicting system behavior of a managed system using pattern recognition techniques
US6522768B1 · kind B1 · utility
Assignee
Inventors
Key dates
| Filing date | Jan 31, 2000 |
| Grant date | Feb 18, 2003 |
| Priority date | — |
| Expiry date | Jan 31, 2020 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG06V10/761
- WIPO fieldComputer technology
- WIPO sectorElectrical engineering
Abstract
A system for predicting system behavior of a managed system includes a measurement module coupled to the managed system to generate measurement data of the managed system. The measurement data include current measurement data and past measurement data. The past measurement data indicate a problem of the managed system. A pattern classification module is coupled to the measurement module to process the past measurement data into a plurality of representative pattern images, and to select a predictor pattern image that best identifies the problem from the pattern images. A pattern matching module is coupled to the pattern classification module and the measurement module to process the current measurement data into a plurality of pattern images using the same image processing technique that generates the predictor pattern image. The pattern matching module also identifies any pattern image that matches the predictor pattern image to predict the problem. A system for generating a predictor pattern image for predicting system behavior of a managed system is also described.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.