Particle image analyzer
US6522781B1 · kind B1 · utility
Assignee
Inventors
Key dates
| Filing date | Dec 6, 1999 |
| Grant date | Feb 18, 2003 |
| Priority date | — |
| Expiry date | Dec 6, 2019 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG06T7/0004
- WIPO fieldComputer technology
- WIPO sectorElectrical engineering
Abstract
A particle image analyzer that facilitates display by designating on a distribution an image desired to be displayed from among a large number of recorded images is disclosed. The particle image analyzer is provided with a parameter computation means for computing at least one characterizing parameter for respective particle images obtained by image capture; a storing means for storing correlations between the particle images and the characterizing parameters with regard to the respective particle images; distribution-diagram generation means for generating characteristic-parameter distribution diagram; designation means for designating the area within the distribution diagram; read-out means for reading out from the memory means particle images corresponding to characterizing parameters within the areas designated by the designation means; and display means for displaying the read-out particle images.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.