Method and system for marking surface deviations on a three dimensional surface
US6522993B1 · kind B1 · utility
16Cited by
12References
36Claims
0Family size
Assignee
Inventor
Key dates
| Filing date | Sep 14, 2001 |
| Grant date | Feb 18, 2003 |
| Priority date | — |
| Expiry date | Sep 14, 2021 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01B11/24
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A method is provided for evaluating and marking deviations of a surface of a part from a design standard for the surface. The method comprises determining a point deviation for each of a plurality of points on the surface and determining deviation regions for the surface. Each deviation region includes only surface points having point deviations within a predefined deviation range associated with the deviation region. The method further comprises preparing a graphical representation of the surface illustrating the deviation regions and applying a copy of the graphical representation to the surface.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.