Vertical height impact testing apparatus
US6523391B1 · kind B1 · utility
Assignee
Inventors
Key dates
| Filing date | Jun 8, 2001 |
| Grant date | Feb 25, 2003 |
| Priority date | — |
| Expiry date | Jun 8, 2021 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01M7/08
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A vertical impact testing apparatus comprises a rigid frame, an anvil connected to the frame, a dart positioned above the anvil, and a dropped-weight mechanism slidably connected to the frame. The frame is comprised of a vertical column, a base, and a guide rail. The vertical column extends for a sufficient distance to securely support a weight assembly through travel from various heights for testing a specimen. To facilitate downward travel of the dropped-weight mechanism at a proper vertical orientation, a guide block is rigidly attached to the weight assembly and the dropped-weight mechanism is slidably mounted to the guide rail. The dart is stabilized by a braced support arm connected to the frame and a bearing acting cooperatively to ensure impact of the dart with the specimen is in the vertical plane and without tilt. The anvil is a solid structure, fixed in position, which contacts and supports the specimen on a side opposite of the dart as the dart impacts the substrate and forces it downward.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.