Fail-safe circuit with low input impedance using active-transistor differential-line terminators
US6525559B1 · kind B1 · utility
Assignee
Inventors
Key dates
| Filing date | Apr 22, 2002 |
| Grant date | Feb 25, 2003 |
| Priority date | — |
| Expiry date | Apr 22, 2022 |
Classification
- Technology area (CPC H)Electricity
- CPC primaryH03K19/007
- WIPO fieldDigital communication
- WIPO sectorElectrical engineering
Abstract
A fail-safe circuit for a pair of differential input lines detects when one or both lines are open. Each line has a pull-up of a switched p-channel transistor in series with a resistor or another p-channel transistor that has its effective resistance controlled by a gate bias. The gate of the switched p-channel transistor is driven to ground when power is applied to the gate of a grounding n-channel transistor. When power is off, a p-channel connecting transistor charges the gate node from the differential input line when a positive voltage is applied to the input line, such as during a leakage test. Charging the gate node prevents the switched p-channel transistor from turning on, blocking a leakage current path through the pull-up. An N-well bias circuit can be added, which connects the N-well under p-channel transistors to power or the gate node or the input line.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.