Patent · US Expired

Non-destructive testing of passive components

US6528985B1 · kind B1 · utility

5Cited by

4References

13Claims

0Family size

Assignee

KONINKLIJKE PHILIPS ELECTRONICS NV · NL

Inventors

Georg Greuel · Roetgen, DE
Rik Van Ark · Roermond, NL

Key dates

Filing date	Nov 2, 2000
Grant date	Mar 4, 2003
Priority date	—
Expiry date	Nov 2, 2020

Classification

Technology area (CPC G)Physics
CPC primaryG01R31/265
WIPO fieldMeasurement
WIPO sectorInstruments

Abstract

A device and a method for the non-destructive testing of passive components by applying an electrical test signal to passive components and an acoustic emission is measured by a microphone and, the measured signal is applied to an evaluation unit.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.