Methods and systems for automated emissions measuring
US6529020B1 · kind B1 · utility
Assignee
Inventor
Key dates
| Filing date | Nov 15, 2000 |
| Grant date | Mar 4, 2003 |
| Priority date | — |
| Expiry date | Nov 19, 2020 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01R31/001
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A system for measuring electromagnetic emissions from electronic devices includes an semi-anechoic chamber, a computer, an EMI receiver, and a multi-device controller. The chamber houses devices being tested and test equipment for automated emissions scanning. The computer receives emissions data from test equipment housed within and outside the chamber and operates a multi-device controller which controls the test equipment. The method includes wide-band measurements of emissions, narrow-band measurements of emissions chosen from the wide-band measurement, determining a maximum quasi-peak value for optimal cable and wiring position, and communicating results to a word-processing program to report measured values against testing limits.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.