Three-dimensional measuring device and three-dimensional measuring method
US6529280B1 · kind B1 · utility
Assignee
Inventors
Key dates
| Filing date | Oct 2, 2000 |
| Grant date | Mar 4, 2003 |
| Priority date | — |
| Expiry date | Oct 28, 2020 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01B11/005
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
This invention is related to a three-dimensional measuring device for measuring three-dimensional positions of an objects. The three-dimensional measuring device comprises an optical projection system and an optical reception system. In a preliminary measurement prior to an actual measurement, the optical projection system projects slit light beam on the object with varying projection angle with in a narrow range, and the optical reception system receives the slit light beam reflected by the object and generates image signals corresponding to an amount of the received light synchronously with variation of the projection angle. Measurement conditions including intensity of the light beam and the projection angle for the actual measurement are set in accordance with the image signals of the actual measurement. Under the measurement conditions, the actual measurement is executed by projection the light beam on the object with varying the projection angle within a wide range.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.