Modulation transfer function characterization employing phased slit reticle
US6529639B1 · kind B1 · utility
Assignee
Inventor
Key dates
| Filing date | Sep 20, 1995 |
| Grant date | Mar 4, 2003 |
| Priority date | — |
| Expiry date | Sep 20, 2015 |
Classification
- Technology area (CPC H)Electricity
- CPC primaryH04N17/00
- WIPO fieldAudio-visual technology
- WIPO sectorElectrical engineering
Abstract
Apparatus and method for determining a modulation transfer function of a plurality of radiation detectors (12). The method includes a step of simultaneously illuminating, with a slit illumination source embodied within a phased slit reticle (16b′), a plurality of detector elements that are disposed within a localized area comprised-of rows and columns of a radiation detector array (10). The phased slit reticle has a two dimensional phase characteristic that is a function of a distance between adjacent detector elements. The method includes a further step of determining, from an electrical signal generated by the illuminated detector elements, a line spread function; and a step of determining, by taking a Fourier Transform of the determined line spread function, the modulation transfer function of the detector elements within the localized area.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.