Process and machine for signal waveform analysis
US6529842B1 · kind B1 · utility
17Cited by
29References
28Claims
0Family size
Assignee
Inventors
Key dates
| Filing date | Nov 8, 1999 |
| Grant date | Mar 4, 2003 |
| Priority date | — |
| Expiry date | Nov 8, 2019 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01R23/16
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
Highly accurate time interval measurement is achieved for an electrical waveform. The electrical waveform is sampled and converted to a series of voltages, and the series of voltages is interpolated in order to form a time tag list, using interpolations that are optimized for time interval measurement and analysis. The time tag list accurately represents the times at which particular events of interest occur, and is used to generate displays and results analysis such as adjacent cycle jitter and accurate differential triggering and analysis.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.