Patent · US Expired

Method for crystallizing amorphous silicon and fabricating thin film transistor using crystallized silicon

US6531348B2 · kind B2 · utility

6Cited by
6References
19Claims
0Family size

Assignee

Inventors

Key dates

Filing dateDec 4, 2001
Grant dateMar 11, 2003
Priority date
Expiry dateDec 4, 2021

Classification

  • Technology area (CPC H)Electricity
  • CPC primaryH10D86/0229
  • WIPO fieldSemiconductors
  • WIPO sectorElectrical engineering

Abstract

A method of crystallizing amorphous silicon includes forming an amorphous silicon layer over a substrate, forming a plurality of metal clusters on the amorphous silicon layer, and simultaneously applying a thermal treatment, an electric field, and a magnetic field to crystallize the amorphous silicon layer.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.