Automatic inspection apparatus and method for simultaneous detection of anomalies in a 3-dimensional translucent object
US6532064B1 · kind B1 · utility
14Cited by
13References
21Claims
0Family size
Assignee
Inventors
Key dates
| Filing date | Oct 16, 2001 |
| Grant date | Mar 11, 2003 |
| Priority date | — |
| Expiry date | Oct 16, 2021 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01N21/958
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
The present invention relates to an automated inspection apparatus for detection of anomalies in a 3D translucent object, the apparatus having a scanhead assembly including an image processing unit and image capture device, a first and a second light source, and conveyor means, the improvement comprising a light block member positioned along a substantially common axis of the image capture device and a light source.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.