Method and apparatus for testing a circuit
US6532559B1 · kind B1 · utility
Assignee
Inventors
Key dates
| Filing date | Jan 26, 2000 |
| Grant date | Mar 11, 2003 |
| Priority date | — |
| Expiry date | Jan 26, 2020 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01R31/2851
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
The present invention relates to methods for performing integrated circuit testing and an apparatus therefore including a data analyzer, a test program server, a data storage unit, and testers. One embodiment includes providing a plurality of software switchable test programs and a first plurality of integrated circuits and running the software switchable test programs on the first plurality of integrated circuits. The method further includes collecting and storing data resulting from the test programs and providing a second plurality of integrated circuits where an analyzer program uses the collected and stored data to determine which of the software switchable tests are bypassable tests. In response to running the analyzer program, the test programs are automatically run without the bypassable tests on a first portion of the second plurality of integrated circuits.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.