Micro-material testing apparatus
US6532805B1 · kind B1 · utility
Assignees
Inventors
Key dates
| Filing date | Feb 26, 1999 |
| Grant date | Mar 18, 2003 |
| Priority date | — |
| Expiry date | Feb 26, 2019 |
Classification
- Technology area (CPC Y)Emerging Cross-Sectional Technologies
- CPC primaryY10T428/125
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
An atomic force microscope including a cantilever, a transferring device and a displacement detecting device is used for conducting a material test of a test member based on a load amount and a displacement amount. The test member may be fixed to the cantilever or may be entirely replaced with the cantilever. The transferring device, which is normally used for transferring the cantilever or the sample in accordance with a shape of the sample, constitutes a load applying device for applying a load to the test member, and a displacement of the test member is detected by the displacement detecting device. The load applying device can apply slight displacement and load to the test member, so that the material test for the small material can be conducted.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.