Patent · US Expired

Test element storage device

US6534017B1 · kind B1 · utility

42Cited by

17References

16Claims

0Family size

Assignee

Roche Diagnostics GMBH · DE

Inventors

Gunter Bottwein · Lampertheim, DE
Reinhard Bär · Mannheim, DE
Hans List · Prien am Chiemsee, DE
Friedrich Heid · Altrip, DE

Key dates

Filing date	May 26, 2000
Grant date	Mar 18, 2003
Priority date	—
Expiry date	May 26, 2020

Classification

Technology area (CPC G)Physics
CPC primaryG01N2035/00118
WIPO fieldMeasurement
WIPO sectorInstruments

Abstract

The invention concerns a magazine for storing test elements (1) with one or several test zones (3) which are attached adjacent to one another on a rectangular support, wherein the magazine has at least one pair of guide grooves (18a, b) located opposite to one another into which the test elements are inserted in such a way that they lie directly adjacent to one another and the edges of adjacent supports abut one another. A further subject matter of the invention is a system which comprises a slide (14, 31) in addition to the magazine according to the invention which is used to push a layer of test elements along the guide grooves towards the opposite end of the layer to remove test elements from the magazine.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.