Parallel screen for rapid thermal characterization of materials
US6536944B1 · kind B1 · utility
26Cited by
25References
44Claims
0Family size
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Key dates
| Filing date | Oct 8, 1999 |
| Grant date | Mar 25, 2003 |
| Priority date | — |
| Expiry date | Oct 8, 2019 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01N2291/106
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A method and apparatus for high-throughput determination of phase change points of combinatorial libraries of metal alloys uses an infrared camera to monitor temperature-dependent changes in emissivity/reflectivity of the alloys. An infrared focal plane array monitors the emissivity/reflectivity changes over time, and the intensity of each heated member over time is correlated with temperature to detect the phase change points of the members.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.