Measurement of heat flux in a heated chamber
US6536945B2 · kind B2 · utility
Assignee
Inventor
Key dates
| Filing date | Oct 1, 2001 |
| Grant date | Mar 25, 2003 |
| Priority date | — |
| Expiry date | Oct 1, 2021 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01K17/20
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A heat flux measuring device for transporting through a heated chamber, the device having an array of sensors, each sensor comprising first and second surfaces bounding a region, a thermally insulating layer substantially occupying said region, and means for providing a signal which is a measure of the temperature difference across the layer. The said first surface of each sensor is in thermal contact with a heat sink and the said second surface of each sensor is exposed. A plurality of the said exposed surfaces of the array are reflective to radiation and a further plurality of the said exposed surfaces of the array are absorbent to radiation, the sensors of the array being so arranged that the area of radiation-absorbing exposed sensor surface and the area of radiation-reflecting exposed sensor surface are each substantially equally distributed about a mid-line of the array extending along the direction in which in use the device will be transported and about a mid-line of the array extending along the direction transverse to the direction in which in use the device will be transported.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.