Microbolometer focal plane array with controlled bias
US6538250B2 · kind B2 · utility
10Cited by
8References
13Claims
0Family size
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Key dates
| Filing date | Jul 5, 2002 |
| Grant date | Mar 25, 2003 |
| Priority date | — |
| Expiry date | Jul 5, 2022 |
Classification
- Technology area (CPC H)Electricity
- CPC primaryH10F39/193
- WIPO fieldAudio-visual technology
- WIPO sectorElectrical engineering
Abstract
A method and apparatus for controlling bias for an microbolometer focal plane array which includes use of one thermally-shorted microbolometer detector thermally shorted to the substrate upon which one or more thermally-isolated microbolometers are constructed. A calibration bias source magnitude is determined and continually adjusted as a function of (i) the temperature related reading value of the resistance of the thermally-shorted microbolometer at calibration, and (ii) the temperature related reading value of the resistance of the thermally-shorted microbolometer after each image sample is taken.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.