Measuring method for mechatronics
US6538428B1 · kind B1 · utility
3Cited by
6References
9Claims
0Family size
Assignee
Inventor
Key dates
| Filing date | Aug 28, 2001 |
| Grant date | Mar 25, 2003 |
| Priority date | — |
| Expiry date | Aug 28, 2021 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01D5/2013
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A measurement method for a mechatronics apparatus, which includes an electromagnetically actuated component, an electronic control circuit, and at least one sensor, is selectively timed to minimize electromagnetic interference between the electromagnetically actuated component and the sensor(s). This is accomplished by restricting a sensor measurement to a time window, during which time the electromagnetically actuated component either has no current flow, or has a current change magnitude that is lower than a predetermined limit.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.