Patent · US Expired

Circuit breaker with a single test button mechanism

US6538862B1 · kind B1 · utility

47Cited by
18References
36Claims
0Family size

Assignee

Inventors

Key dates

Filing dateNov 26, 2001
Grant dateMar 25, 2003
Priority date
Expiry dateNov 26, 2021

Classification

  • Technology area (CPC H)Electricity
  • CPC primaryH01H2083/201
  • WIPO fieldElectrical machinery, apparatus, energy
  • WIPO sectorElectrical engineering

Abstract

In an exemplary embodiment of the invention, a dual test mechanism is presented for use in a circuit breaker. More specifically, the dual test mechanism includes a dual test button which comprises a single switch for testing both the AFCI and GFCI circuits of the breaker. The test mechanism includes a circuit board, which forms a part of the circuit breaker, and a test button assembly which includes a test button and signaling components which are electrically connected to the circuit board.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.