Patent · US Expired

Method of detecting cause of failure in computer

US6539498B1 · kind B1 · utility

5Cited by
10References
10Claims
0Family size

Assignee

Inventor

Key dates

Filing dateJan 10, 2000
Grant dateMar 25, 2003
Priority date
Expiry dateJan 10, 2020

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG06F11/277
  • WIPO fieldComputer technology
  • WIPO sectorElectrical engineering

Abstract

A method of detecting a cause of a failure in a computer includes the steps of performing real-device testing by having a computer execute all instructions of a test program, performing simulator testing by having the computer execute part of the instructions of the test program and having a simulator execute the remainder of the instructions of the test program, and comparing results of the real-device testing with results of the simulator testing so as to identify a portion of the test program that causes a failure.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.