Integrated circuit with alternately selectable state evaluation provisions
US6539507B1 · kind B1 · utility
11Cited by
3References
17Claims
0Family size
Assignee
Inventors
Key dates
| Filing date | Nov 10, 1999 |
| Grant date | Mar 25, 2003 |
| Priority date | — |
| Expiry date | Nov 10, 2019 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01R31/318558
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
An integrated circuit incorporating test access provisions and a system addressable command control register; and provisions for selectably enabling and accessing one or the other for purposes of evaluating integrated circuit functionality.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.