Patent · US Expired

Test apparatus for measuring stresses and strains

US6539809B1 · kind B1 · utility

14Cited by
6References
12Claims
0Family size

Assignee

Inventors

Key dates

Filing dateApr 6, 2000
Grant dateApr 1, 2003
Priority date
Expiry dateApr 6, 2020

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG01N2203/0075
  • WIPO fieldMeasurement
  • WIPO sectorInstruments

Abstract

A test apparatus is provided for measuring loads applied to an object and for measuring the deformation of the object in response to the loads. The test apparatus includes a stationary work head and a movable arm. The movable arm is selectively movable toward or away from the stationary work head. A load cell has a driven end mounted to the movable arm and a sensing end spaced from the movable arm. A movable work head is mounted to the sensing end and is configured for applying a load to a test object positioned between the stationary and movable work heads. A liner scale also is mounted to the sensing end of the load cell, and a linear encoder or read head is mounted in spaced relationship to the linear scale. The encoder reads deflection in the apparatus in view of loads applied during a test. A controller is provided for moving the movable work head in accordance with test parameters. The controller also receives output from the load cell and the read head, and uses that outputted information to develop stress-strain analytical data.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.